PD ISO/TR 22335:2007 - Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer

PD ISO/TR 22335:2007

Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer

Status : Confirmed, Current   Published : August 2007

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Standard NumberPD ISO/TR 22335:2007
TitleSurface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
StatusConfirmed, Current
Publication Date31 August 2007
Confirm Date14 September 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 5436-1:2000, ISO 18115:2001, ISO 14606:2000, ISO/TR 15969:2001, ISO 13565-3:1998, ASME B46.1-1995, ISO 12179:2000, ISO 13565-1:1996
International RelationshipsISO/TR 22335:2007
Draft Superseded By04/30098988 DC
DescriptorsChemical analysis and testing, X-ray fluorescence spectrometry, Profilometers, Depth, Surface chemistry, Profile measurement, Surface properties, Spectroscopy, Spectrochemical analysis, Electron beams, X-ray analysis
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Profilage en profondeur. Mesurage de la vitesse de pulvérisation. Méthode par empreinte de grille au moyen d'un profilomètre à stylet mécanique
Title in GermanChemische Analytik an Oberflächen. Tiefenprofilanalyse. Messung der Ionenstrahlzerstäubungs-Geschwindigkeit mittels der Gitter-Kopiermethode mit dem mechanischen Stylus Profilometer
CommitteeCII/60
ISBN978 0 580 54014 1
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size2.55 MB
Price£182.00


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