BS EN 61967-2:2005 - Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of radiated emissions. TEM cell and wideband TEM cell method

BS EN 61967-2:2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of radiated emissions. TEM cell and wideband TEM cell method

Status : Under review, Current   Published : January 2006

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This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell. The test board is not inside the cell, as in the conventional usage, but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured radio frequency (RF) voltage will be affected by many factors. The primary factor affecting the measured RF voltage is the septum to IC test board (cell wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to floor spacing of 45 mm and a GTEM cell with average septum to floor spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations. A conversion factor may allow comparisons between data measured on TEM or GTEM cells with different septum to floor spacing. The IC test board controls the geometry and orientation of the operating IC relative to the cell and eliminates any connecting leads within the cell (these are on the backside of the board, which is outside the cell). For the TEM cell, one of the 50 ports is terminated with a 50 load. The other 50 port for a TEM cell, or the single 50 port for a GTEM cell, is connected to the input of a spectrum analyser or receiver that measures the RF emissions emanating from the integrated circuit and impressed onto the septum of the cell.




Standard NumberBS EN 61967-2:2005
TitleIntegrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of radiated emissions. TEM cell and wideband TEM cell method
StatusUnder review, Current
Publication Date23 January 2006
Normative References(Required to achieve compliance to this standard)EN 61967-1:2002, IEC 61967-1, IEC 60050-131:2002, IEC 60050-161:1990
Informative References(Provided for Information)CISPR 16-2-2:2003, CISPR 16-1-4:2003, CISPR 16-2-4:2003, CISPR 16-1-1:2003, IEC 61000-4-20:2003, CISPR 16-2-3:2003, CISPR 16-1-2:2003, IEC 61000-4-3:1993, CSPR 16-1-5:2003, CISPR 16-2-1:2003, CISPR 16-1-3:2004
International RelationshipsIEC TR 62001:2009,IEC 61967-2:2005,EN 61967-2:2005
Draft Superseded By03/112146 DC
DescriptorsElectromagnetic fields, Printed-circuit boards, Integrated circuits, Radio disturbances, Radiofrequencies, Electrical measurement, Noise (spurious signals), Wideband amplifiers, Electromagnetic tests, Emission, Circuits, Electromagnetic radiation, Electromagnetic compatibility, Electronic equipment and components
ICS29.200
29.240.99
31.080.99
31.200
33.100.10
Title in FrenchCircuits integres. Mesure des emissions electromagnetiques, 150 kHz a 1 GHz. Mesure des emissions rayonnees. Methode de cellule TEM et cellule TEM a large bande
Title in GermanIntegrierte Schaltungen. Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz. Messung der abgestrahlten Aussendungen. TEM-Zellen- und Breitband-TEMZellenverfahren
CommitteeEPL/47
ISBN0 580 47476 3
PublisherBSI
FormatA4
DeliveryYes
Pages26
File Size1.292 MB
Price£182.00


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