BS EN 62276:2005 - Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

BS EN 62276:2005

Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

Status : Revised, Superseded, Withdrawn   Published : February 2006 Replaced By : BS EN 62276:2013

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Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.




Standard NumberBS EN 62276:2005
TitleSingle crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods
StatusRevised, Superseded, Withdrawn
Publication Date14 February 2006
Withdrawn Date28 February 2013
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 62276:2013
ReplacesPD IEC/PAS 62276:2002
International RelationshipsEN 62276:2005,IEC 62276:2005
Draft Superseded By03/108069 DC
DescriptorsSubstrates (insulating), Acoustic measurement, Quartz, Crystals (electronic), Electromechanical filters, Acoustic waves, Dielectric devices, Acoustic filters, Electrical wave measurement, Acoustoelectric devices, Crystal resonators, Piezoelectric devices
ICS31.140
Title in FrenchTranches monocristallines pour applications utilisant des dispositifs a ondes acoustiques de surface. Specifications et methodes de mesure
Title in GermanEinkristall-Wafer fuer Oberflaechenwellen- (OFW-) Bauelemente. Festlegungen und Messverfahren
CommitteeEPL/49
ISBN0 580 47074 1
PublisherBSI
FormatA4
DeliveryNo
Pages38
File Size1.25 MB
Price£214.00


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