BS EN 60749-28:2017 - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

BS EN 60749-28:2017

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

Status : Current, Under review   Published : July 2017

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HARDCOPY



IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex I.


The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.




Standard NumberBS EN 60749-28:2017
TitleSemiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
StatusCurrent, Under review
Publication Date10 July 2017
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEC 60749-26:2013, EN 60749-26:2014
International RelationshipsEN 60749-28:2017,IEC 60749-28 Ed.1.0
Draft Superseded By02/209644 DC
DescriptorsElectrostatics, Electric charge, Electronic equipment and components, Electric discharges, Mechanical testing, Semiconductor devices, Test methods, Environmental testing, Integrated circuits
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essai mécaniques et climatiques Essai de sensibilité aux décharges électrostatiques (DES). Modèle de dispositif chargé par contact direct (DC-CDM)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Charged Device Model (CDM). Device Level
CommitteeEPL/47
ISBN978 0 580 53678 6
PublisherBSI
FormatA4
DeliveryYes
Pages50
File Size2.687 MB
Price£240.00


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