BS ISO 15632:2002 - Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

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BS ISO 15632:2002

Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

Status : Revised, Withdrawn   Published : December 2002 Replaced By : BS ISO 15632:2012

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Standard NumberBS ISO 15632:2002
TitleMicrobeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
StatusRevised, Withdrawn
Publication Date19 December 2002
Withdrawn Date31 August 2012
Cross ReferencesISO/IEC 17025, ISO 18115, IEC 60759, ANSI/IEEE 759, ASTM E1508
Replaced ByBS ISO 15632:2012
International RelationshipsISO 15632:2002
Draft Superseded By00/122580 DC
DescriptorsSemiconductor diodes, Spectroscopy, Semiconductors, Detectors, Chemical analysis and testing, X-ray fluorescence spectrometry, Electron beams
ICS19.100
37.020
71.040.99
Title in FrenchAnalyse par microfaisceaux. Specifications instrumentales pour spectrometres a rayons X a dispersion d'energie avec detecteurs a semiconducteurs
Title in GermanAnalysenverfahren mit Feinstrahltechnik. Instrumentelle Spezifikation fuer energiedispersive Roentgenspektrometer mit Halbleiter-Dioden-Detektoren
CommitteeCII/9
ISBN0 580 40967 8
PublisherBSI
FormatA4
DeliveryNo
Pages16
File Size438 KB
Price£130.00


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