BS EN 60749-10:2002 - Semiconductor devices. Mechanical and climatic test methods. Mechanical shock

BS EN 60749-10:2002

Semiconductor devices. Mechanical and climatic test methods. Mechanical shock

Status : Current   Published : August 2002



Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Standard NumberBS EN 60749-10:2002
TitleSemiconductor devices. Mechanical and climatic test methods. Mechanical shock
Publication Date28 August 2002
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60749-10:2002,EN 60749-10 (IEC 60749-10:2002
Amended ByAmd 14112 (Corr to BS EN 60749-10:2002)
Corrigendum, September 2002
DescriptorsIntegrated circuits, Destructive testing, Electronic equipment and components, Mechanical shock, Environmental testing, Climate, Mechanical testing, Impact testing, Semiconductor devices
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Chocs mecaniques
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Mechanisches Schocken
ISBN0 580 40292 4
File Size311 KB

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