BS EN 60749-13:2002 - Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

BS EN 60749-13:2002

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

Status : Superseded, Withdrawn   Published : August 2002 Replaced By : BS EN IEC 60749-13:2018

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Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.




Standard NumberBS EN 60749-13:2002
TitleSemiconductor devices. Mechanical and climatic test methods. Salt atmosphere
StatusSuperseded, Withdrawn
Publication Date28 August 2002
Withdrawn Date26 April 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN IEC 60749-13:2018
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-13 (IEC 60749-13:2002,IEC 60749-13:2002
Amended ByAMD 14113
Corrigendum, September 2002
DescriptorsCorrosion resistance, Electronic equipment and components, Accelerated corrosion tests, Integrated circuits, Destructive testing, Environmental testing, Mechanical testing, Salts, Salt-spray tests, Accelerated testing, Climate, Semiconductor devices
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Atmosphere saline
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Salzatmosphaere
CommitteeEPL/47
ISBN0 580 40293 2
PublisherBSI
FormatA4
DeliveryYes
Pages10
File Size314 KB
Price£110.00


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