BS ISO 20341:2003 - Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
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BS ISO 20341:2003

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials

Status : Confirmed, Current   Published : August 2003

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 20341:2003
TitleSurface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
StatusConfirmed, Current
Publication Date08 August 2003
Confirm Date04 October 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsISO 20341:2003
Draft Superseded By02/122923 DC
DescriptorsMass spectrometry, Statistical methods of analysis, Spectroscopy, Normal distribution, Surface chemistry, Chemical analysis and testing, Damping coefficient, Depth measurement, Surface properties, Test methods, Mathematical calculations, Secondary, Ions, Depth
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Spectrometrie de masse des ions secondaires. Methode d'estimation des parametres de resolution en profondeur a l'aide de materiaux de reference multicouches minces
CommitteeCII/60
ISBN0 580 42439 1
PublisherBSI
FormatA4
DeliveryYes
Pages14
File Size326 KB
Price£110.00


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