BS EN 60749-25:2003 - Semiconductor devices. Mechanical and climatic test methods. Temperature cycling

BS EN 60749-25:2003

Semiconductor devices. Mechanical and climatic test methods. Temperature cycling

Status : Current   Published : October 2003

Format
PDF

Format
HARDCOPY



Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.




Standard NumberBS EN 60749-25:2003
TitleSemiconductor devices. Mechanical and climatic test methods. Temperature cycling
StatusCurrent
Publication Date30 October 2003
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-25:2003,IEC 60749-25:2003,EN 60068-2-30:1999
Draft Superseded By02/204668 DC
DescriptorsThermal testing, Solders, Electronic equipment and components, Integrated circuits, Environmental testing, Climate, Testing conditions, Thermal-cycling tests, Semiconductor devices, Heating tests, Mechanical testing
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Cycles de temperature
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Zyklische Temperaturwechsel
CommitteeEPL/47
ISBN0 580 42859 1
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size721 KB
Price£130.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Worldwide Standards
We can source any standard from anywhere in the world


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


Develop a PAS

Develop a fast-track standardization document in 9-12 months