BS EN 60749-12:2002 - Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency

BS EN 60749-12:2002

Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency

Status : Superseded, Withdrawn   Published : September 2002 Replaced By : BS EN IEC 60749-12:2018

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Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.




Standard NumberBS EN 60749-12:2002
TitleSemiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
StatusSuperseded, Withdrawn
Publication Date10 September 2002
Withdrawn Date18 April 2018
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN IEC 60749-12:2018
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60749-12:2002,EN 60749-12 (IEC 60749-12:2002
Draft Superseded By00/203572 DC
DescriptorsVibration testing, Semiconductor devices, Integrated circuits, Electronic equipment and components, Climate, Environmental testing, Mechanical testing, Destructive testing, Frequencies, Variable
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Vibrations, frequences variables
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Schwingen, variable Frequenz
CommitteeEPL/47
ISBN0 580 40333 5
PublisherBSI
FormatA4
DeliveryYes
Pages8
File Size262 KB
Price£110.00


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