BS EN 60749-4:2002 - Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)

BS EN 60749-4:2002

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)

Status : Superseded, Withdrawn   Published : September 2002 Replaced By : BS EN 60749-4:2017

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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.




Standard NumberBS EN 60749-4:2002
TitleSemiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
StatusSuperseded, Withdrawn
Publication Date10 September 2002
Withdrawn Date28 November 2017
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60749-4:2017
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-4 (IEC 60749-4:2002),IEC 60749-4:2002
Draft Superseded By00/203564 DC
DescriptorsClimate, Electronic equipment and components, Integrated circuits, Environmental testing, Accelerated testing, Damp-heat tests, Mechanical testing, Semiconductor devices
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Essai continu fortement accelere de contrainte de chaleur humide (HAST)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Feuchte Waerme, konstant, Pruefung mit hochbeschleunigter Wirkung (HAST)
CommitteeEPL/47
ISBN0 580 40335 1
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size365 KB
Price£110.00


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