BS EN 60749-2:2002 - Semiconductor devices. Mechanical and climatic test methods. Low air pressure
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BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods. Low air pressure

Status : Current   Published : September 2002

Format
PDF

Format
HARDCOPY



Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.




Standard NumberBS EN 60749-2:2002
TitleSemiconductor devices. Mechanical and climatic test methods. Low air pressure
StatusCurrent
Publication Date24 September 2002
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60749-2:2002,EN 60749-2:2002
Draft Superseded By00/203558 DC
DescriptorsIntegrated circuits, Pressure, Electronic equipment and components, Semiconductor devices, Climate, Air, Low-pressure tests, Mechanical testing, Environmental testing
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Basse pression atmospherique
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Niedriger Luftdruck
CommitteeEPL/47
ISBN0 580 40397 1
PublisherBSI
FormatA4
DeliveryYes
Pages10
File Size275 KB
Price£110.00


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