BS EN 60749-6:2002 - Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature

BS EN 60749-6:2002

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature

Status : Superseded, Withdrawn   Published : September 2002 Replaced By : BS EN 60749-6:2017

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Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.




Standard NumberBS EN 60749-6:2002
TitleSemiconductor devices. Mechanical and climatic test methods. Storage at high temperature
StatusSuperseded, Withdrawn
Publication Date10 September 2002
Withdrawn Date24 November 2017
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60749-6:2017
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60749-6:2002,EN 60749-6:2002
Draft Superseded By01/208602 DC
DescriptorsIntegrated circuits, Semiconductor devices, Semiconductor storage, Mechanical testing, Climate, Electronic equipment and components, Electronic storage, Environmental testing, High temperatures
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Stockage a haute temperature
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren Lagerung bei hoher Temperatur
CommitteeEPL/47
ISBN0 580 40334 3
PublisherBSI
FormatA4
DeliveryYes
Pages8
File Size300 KB
Price£110.00


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