BS EN 60749-36:2003 - Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state

BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state

Status : Current   Published : June 2003

Format
PDF

Format
HARDCOPY



Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.




Standard NumberBS EN 60749-36:2003
TitleSemiconductor devices. Mechanical and climatic test methods. Acceleration, steady state
StatusCurrent
Publication Date19 June 2003
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60749-36:2003,EN 60749-36:2003
Draft Superseded By01/208601 DC
DescriptorsEndurance testing, Integrated circuits, Impact testing, Semiconductor devices, Mechanical testing, Electronic equipment and components, Acceleration measurement, Acceleration tests, Climate, Environmental testing, Stress, Destructive testing
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Acceleration constante
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Gleichmaessiges Beschleunigen
CommitteeEPL/47
ISBN0 580 42065 5
PublisherBSI
FormatA4
DeliveryYes
Pages8
File Size293 KB
Price£110.00


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