PD IEC/PAS 62277:2002, IEC/PAS 62277:2001 - Test-fixture of surface mounting quartz crystal units

PD IEC/PAS 62277:2002, IEC/PAS 62277:2001

Test-fixture of surface mounting quartz crystal units

Status : Superseded, Withdrawn   Published : February 2002 Replaced By : BS EN 60444-8:2003

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Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.




Standard NumberPD IEC/PAS 62277:2002, IEC/PAS 62277:2001
TitleTest-fixture of surface mounting quartz crystal units
StatusSuperseded, Withdrawn
Publication Date01 February 2002
Withdrawn Date19 November 2003
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60444-8:2003
International RelationshipsIEC PAS 62277:2001
DescriptorsCalibration, Piezoelectric devices, Circuits, Electrical equipment, Frequencies, Dielectric devices, Electronic equipment and components, Crystals (electronic), Crystal resonators, Electrical properties and phenomena
ICS31.140
CommitteeEPL/49
ISBN0 580 38979 0
PublisherBSI
FormatA4
DeliveryNo
Pages16
File Size692 KB
Price£130.00


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