PD IEC/PAS 62276:2002 - Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
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PD IEC/PAS 62276:2002

Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

Status : Superseded, Withdrawn   Published : February 2002 Replaced By : BS EN 62276:2005

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Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.




Standard NumberPD IEC/PAS 62276:2002
TitleSingle crystal wafers applied for surface acoustic wave device. Specification and measuring method
StatusSuperseded, Withdrawn
Publication Date05 February 2002
Withdrawn Date14 February 2006
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 62276:2005
International RelationshipsIEC PAS 62276:2001
DescriptorsCrystals (electronic), Acoustoelectric devices, Acoustic waves, Electronic equipment and components, Crystal resonators, Acoustic filters, Resonators, Electromechanical filters, Dielectric devices, Lithium, Electrical wave measurement, Acoustic measurement, Quartz, Acoustic wave devices, Piezoelectric devices, Substrates (insulating)
ICS31.140
Title in GermanEinkristalline Wafer zur Verwendung fuer Oberflaechenwellen-Bauelemente. Spezifikation und Messverfahren
CommitteeEPL/49
ISBN0 580 38980 4
PublisherBSI
FormatA4
DeliveryNo
Pages40
File Size942 KB
Price£214.00


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