DD ISO/TR 15969:2001 - Surface chemical analysis. Depth profiling. Measurement of sputtered depth

DD ISO/TR 15969:2001

Surface chemical analysis. Depth profiling. Measurement of sputtered depth

Status : Current   Published : October 2001

Format
PDF

Format
HARDCOPY






Standard NumberDD ISO/TR 15969:2001
TitleSurface chemical analysis. Depth profiling. Measurement of sputtered depth
StatusCurrent
Publication Date01 October 2001
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsISO/TR 15969:2001
DescriptorsSurface chemistry, Surface properties, Chemical analysis and testing, Depth, Profile measurement, Dimensional measurement, Control samples, Spectrochemical analysis, Spectroscopy, Electron emission, X-rays, Mass spectrometry, Radiation measurement
ICS17.040.20
71.040.40
Title in FrenchAnalyse chimique des surfaces. Profilage d'epaisseur. Mesurage de l'epaisseur bombardee
CommitteeCII/60
ISBN0 580 38501 9
PublisherBSI
FormatA4
DeliveryYes
Pages22
File Size1.359 MB
Price£130.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


BSOL

The faster, easier way to work with standards


Develop a PAS

Develop a fast-track standardization document in 9-12 months