BS EN 60747-5-3:2001 - Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods

BS EN 60747-5-3:2001

Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods

Status : Current, Superseded, Work in hand   Published : January 1998 Replaced By : BS EN 60747-5-5:2011+A1:2015

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Standard NumberBS EN 60747-5-3:2001
TitleDiscrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
StatusCurrent, Superseded, Work in hand
Publication Date15 January 1998
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60747-5-5:2011+A1:2015
International RelationshipsEN 60747-5-3:2001,IEC 60747-5-3:1997/AMD1:2002,IEC 61691-4:2004
Amended ByAMD 13434
Amendment, January 2003
Draft Superseded By00/202969 DC
DescriptorsRadiation, Measuring instruments, Semiconductor devices, Integrated circuits, Optoelectronic devices, Light emission, Luminosity, Voltage, Emission, Intensity, Light-emitting devices, Phototransistors, Light-sensitized materials, Electronic equipment and components, Photometers
ICS25.040.01
31.080.99
31.260
35.060
Title in FrenchDispositifs discrets a semiconducteurs et circuits integres. Dispositifs optoelectroniques. Methodes de mesure
Title in GermanEinzel-Halbleiterbauelemente und integrierte Schaltungen. Optoelektronische Bauelemente. Messverfahren
CommitteeEPL/47
ISBN0 580 29145 6
PublisherBSI
FormatA4
DeliveryYes
Pages48
File Size1.449 MB
Price£240.00


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