BS EN 60749-1:2003 - Semiconductor devices. Mechanical and climatic test methods. General

BS EN 60749-1:2003

Semiconductor devices. Mechanical and climatic test methods. General

Status : Current   Published : July 2003

Format
PDF

Format
HARDCOPY



Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.




Standard NumberBS EN 60749-1:2003
TitleSemiconductor devices. Mechanical and climatic test methods. General
StatusCurrent
Publication Date07 July 2003
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-1 (IEC 60749-1:2002),IEC 60749-1:2002
Draft Superseded By01/203181 DC
DescriptorsEnvironmental testing, Testing conditions, Semiconductor devices, Integrated circuits, Mechanical testing, Electronic equipment and components, Climate
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Generalites
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Allgemeines
CommitteeEPL/47
ISBN0 580 42198 8
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size312 KB
Price£110.00


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