BS ISO 14606:2000 - Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

BS ISO 14606:2000

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

Status : Revised, Withdrawn   Published : January 2001 Replaced By : BS ISO 14606:2015

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Standard NumberBS ISO 14606:2000
TitleSurface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
StatusRevised, Withdrawn
Publication Date15 January 2001
Confirm Date01 February 2007
Withdrawn Date31 December 2015
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS ISO 14606:2015
International RelationshipsISO 14606:2000
Draft Superseded By99/121064 DC
DescriptorsAugers, Depth, Electron emission, Microscopic analysis, Control samples, Surface chemistry, Chemical analysis and testing, Laminates, Profile measurement, Mass spectrometry, Spectroscopy, Reference conditions, X-rays, Surface properties, Spectrochemical analysis, Radiation measurement
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Profilage d'epaisseur par bombardement. Optimisation a l'aide de systemes mono- ou multicouches comme materiaux de reference
Title in GermanChemische Analytik an Oberflaechen. Tiefenprofilanalyse mit Ionenstrahlzerstaeubung. Optimierung mit Hilfe von Referenzschichtsystemen
CommitteeCII/60
ISBN0 580 36853 X
PublisherBSI
FormatA4
DeliveryNo
Pages24
File Size293 KB
Price£182.00


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