ISO 12179:2000 - Specification for the methodolgy for surface metrology calibration and verification for surface profiling instruments

ISO 12179:2000

Specification for the methodolgy for surface metrology calibration and verification for surface profiling instruments

Status : Current, Under review   Published : March 2000

Format
PDF

Format
HARDCOPY






Standard NumberISO 12179:2000
TitleSpecification for the methodolgy for surface metrology calibration and verification for surface profiling instruments
StatusCurrent, Under review
Publication Date15 March 2000
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ICS17.040.30
CommitteeTPR/1
PublisherISO
FormatA4
DeliveryYes
Pages25
File Size600 KB
Price£71.00


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