BS EN 60749-5:2003 - Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
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BS EN 60749-5:2003

Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test

Status : Superseded, Withdrawn   Published : June 2003 Replaced By : BS EN 60749-5:2017

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Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.




Standard NumberBS EN 60749-5:2003
TitleSemiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
StatusSuperseded, Withdrawn
Publication Date18 June 2003
Withdrawn Date20 July 2017
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60749-5:2017
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-5 (IEC 60749-5:2003),IEC 60749-5:2003
Draft Superseded By00/203277 DC
DescriptorsIntegrated circuits, Humidity, Semiconductor devices, Mechanical testing, Environmental testing, Damp-heat tests, Climate, Destructive testing, Electronic equipment and components, Watertightness tests, Endurance testing, Thermal testing
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Essai continu de duree de vie sous temperature et humidite avec polarisation
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Lebensdauerpruefung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung
CommitteeEPL/47
ISBN0 580 42060 4
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size342 KB
Price£112.00


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