BS IEC 60747-14-2:2000 - Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements

BS IEC 60747-14-2:2000

Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements

Status : Current, Under review   Published : May 2001

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Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.




Standard NumberBS IEC 60747-14-2:2000
TitleDiscrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements
StatusCurrent, Under review
Publication Date15 May 2001
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 60747-14-2:2000
Draft Superseded By93/200028 DCWD/93/200028DC
DescriptorsProbes, Hall effect, Semiconductor devices, Electronic equipment and components, Magnetic field effects, Integrated circuits
ICS31.080.01
31.080.99
Title in FrenchDispositifs a semiconducteurs. Capteurs a semiconducteurs. Elements a effet de Hall
Title in GermanHalbleiterbauelemente. Halbleiter-Sensoren. Hall-Elemente
CommitteeEPL/47
ISBN0 580 37313 4
PublisherBSI
FormatA4
DeliveryYes
Pages18
File Size360 KB
Price£134.00


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