Standard Number | BS IEC 60747-14-2:2000 |
Title | Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements |
Status | Current, Under review |
Publication Date | 15 May 2001 |
Normative References(Required to achieve compliance to this standard) | No other standards are normatively referenced |
Informative References(Provided for Information) | No other standards are informatively referenced |
International Relationships | IEC 60747-14-2:2000 |
Draft Superseded By | 93/200028 DCWD/93/200028DC |
Descriptors | Probes, Hall effect, Semiconductor devices, Electronic equipment and components, Magnetic field effects, Integrated circuits |
ICS | 31.080.01 31.080.99
|
Title in French | Dispositifs a semiconducteurs. Capteurs a semiconducteurs. Elements a effet de Hall |
Title in German | Halbleiterbauelemente. Halbleiter-Sensoren. Hall-Elemente |
Committee | EPL/47 |
ISBN | 0 580 37313 4 |
Publisher | BSI |
Format | A4 |
Delivery | Yes |
Pages | 18 |
File Size | 360 KB |
Price | £134.00 |