BS IEC 60747-14-1:2000 - Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. General and classification. Sensor generals and classification for semiconductor sensors

BS IEC 60747-14-1:2000

Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. General and classification. Sensor generals and classification for semiconductor sensors

Status : Revised, Withdrawn   Published : April 2001 Replaced By : BS IEC 60747-14-1:2010

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Describes general items concerning the specifications for sensors which are basically made of semiconductor materials, but also applicable to sensors using dielectric or ferroelectric materials.




Standard NumberBS IEC 60747-14-1:2000
TitleDiscrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. General and classification. Sensor generals and classification for semiconductor sensors
StatusRevised, Withdrawn
Publication Date15 April 2001
Withdrawn Date30 April 2010
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS IEC 60747-14-1:2010
International RelationshipsIEC 60747-14-1:2000
Draft Superseded By98/232612 DC
DescriptorsSemiconductors, Ferroelectric materials, Probes, Integrated circuits, Electronic equipment and components, Semiconductor devices, Dielectric materials
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Capteurs a semiconducteurs. Generalites et classification
Title in GermanHalbleiterbauelemente. Halbleitersensoren. Allgemeines und Klassifikation
CommitteeEPL/47
ISBN0 580 36963 3
PublisherBSI
FormatA4
DeliveryNo
Pages14
File Size211 KB
Price£110.00


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