BS 9970-0:1985, IEC 60747-10:1984 QC 700000:19 - Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification

BS 9970-0:1985, IEC 60747-10:1984 QC 700000:19

Harmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification

Status : Superseded, Withdrawn   Published : May 1985 Replaced By : BS IEC 60747-10:1991

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Provides scope and general details, quality assessment procedures, test and measurement procedures and details of sampling plans.




Standard NumberBS 9970-0:1985, IEC 60747-10:1984 QC 700000:19
TitleHarmonized system of quality assessment for electronic components. Semiconductor devices. Generic specification
StatusSuperseded, Withdrawn
Publication Date31 May 1985
Withdrawn Date30 September 1991
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS IEC 60747-10:1991
International RelationshipsQC 700000:1984,IEC 60747-10:1984
DescriptorsElectronic equipment and components, Approval testing, Specification (approval), Marking, Mechanical testing, Integrated circuits, Quality assurance systems, Performance testing, Qualification approval, Inspection, Semiconductor devices, Orientation, Quality control, Endurance testing, Assessed quality, Sampling methods, Statistical quality control, Testing conditions
ICS31.080.01
31.200
Title in FrenchSystème harmonisé d'assurance de la qualité des composants électroniques. Dispositifs à semiconducteurs. Spécification générique
Title in GermanHarmonisiertes Guetebestaetigungssystem fuer Bauelemente der Elektronik. Halbleiterbauelemente. Fachgrundspezifikation
CommitteeEPL/47
ISBN0 580 14495 X
PublisherBSI
FormatA4
DeliveryNo
Pages28
File Size1.25 MB
Price£182.00


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