BS 9352:1980 - Rules for the preparation of detail specifications for semiconductor devices of assessed quality: field effect transistors for microwave applications

BS 9352:1980

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: field effect transistors for microwave applications

Status : Withdrawn   Published : July 1980

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Lists the ratings, characteristics, inspection requirements and supplementary information for field effect transistors which shall be included in any detail specification for these devices.




Standard NumberBS 9352:1980
TitleRules for the preparation of detail specifications for semiconductor devices of assessed quality: field effect transistors for microwave applications
StatusWithdrawn
Publication Date15 July 1980
Confirm Date15 March 1985
Withdrawn Date15 March 1993
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
DescriptorsField-effect transistors, Transistors, Microwaves, Semiconductor devices, Microwave devices, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions
ICS31.080.30
Title in FrenchRegles pour la preparation de specifications detaillees pour dispositifs semi-conducteurs de qualite evaluee: transistors a effet de champ pour applications hyperfrequences
Title in GermanHalbleitergeraete (guetebestaetigt). Vorbereitungsregeln fuer Detailspezifikationen. Feldeffekttransistoren fuer den Mikrowellengebrauch
PublisherBSI
FormatA4
DeliveryNo
Pages10
File Size384 KB
Price£110.00


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