BS EN 60444-2:1997, IEC 60444-2:1980 - Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units

BS EN 60444-2:1997, IEC 60444-2:1980

Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units

Status : Current   Published : September 1993

Format
PDF

Format
HARDCOPY






Standard NumberBS EN 60444-2:1997, IEC 60444-2:1980
TitleMeasurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units
StatusCurrent
Publication Date15 September 1993
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsEN 60444-2:1997,IEC 60444-2:1980
Amended ByAMD 9658
DescriptorsCrystal resonators, Resonators, Piezoelectric devices, Dielectric devices, Quartz, Capacitance, Wave properties and phenomena, Capacitance measurement, Errors, Electrical wave measurement, Electrical measurement, Dielectric properties, Phase measurement (electric), Resonant frequency, Frequency measurement, Frequencies, Circuits, Circuit networks, Mathematical calculations
ICS31.140
Title in FrenchMesure des parametres des quartz piezoelectriques par la technique de phase nulle dans le circuit en pi. Methode de decalage de phase pour la mesure de la capacite dynamique des quartz
Title in GermanMessung der Schwingquarz-parametern nach dem Null-Phasenverfahrens in einem Pi-Netzwerk. Messung der dynamischen Kapazitaet von Schwingquarzen nach dem Phasenoffsetverfahren
CommitteeEPL/49
ISBN0 580 22497 X
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size433.7 KB
Price£130.00


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