BS IEC 61649:1997 - Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

BS IEC 61649:1997

Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

Status : Superseded, Withdrawn   Published : September 1997 Replaced By : BS EN 61649:2008

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Standard NumberBS IEC 61649:1997
TitleProcedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
StatusSuperseded, Withdrawn
Publication Date15 September 1997
Withdrawn Date28 February 2009
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 61649:2008
International RelationshipsIEC 61649:1997
Draft Superseded By90/97507 DC
DescriptorsConfidence limits, Statistical methods of analysis, Electrical components, Electrical equipment, Electronic equipment and components, Statistical testing, Statistical distribution, Estimation, Accuracy, Failure (quality control), Statistical tolerance intervals, Normal distribution, Reliability, Formulae (mathematics)
ICS03.120.30
21.020
29.020
Title in FrenchProcedures pour le test d'adequation, les intervalles de confiance et les limites inferieures de confiance pour les donnees suivant la distribution de Weibull
Title in GermanAnpassungstests, Bestimmung der Vertrauensbereiche und der unteren Grenze des Vertrauensbereiches fuer Daten, die einer Weibull-Verteilung folgen
CommitteeDS/1
ISBN0 580 28098 5
PublisherBSI
FormatA4
DeliveryNo
Pages16
File Size481.6 KB
Price£130.00


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