DD ENV 50219:1996 - Description of the reliability test structures of the European mini test chip

DD ENV 50219:1996

Description of the reliability test structures of the European mini test chip

Status : Withdrawn   Published : September 1996

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Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).




Standard NumberDD ENV 50219:1996
TitleDescription of the reliability test structures of the European mini test chip
StatusWithdrawn
Publication Date15 September 1996
Confirm Date01 August 2004
Withdrawn Date20 April 2012
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsENV 50219:1996
Draft Superseded By95/210784 DC
DescriptorsIntegrated circuits, Test equipment, Digital integrated circuits, Microprocessor chips, Reliability, Assessed reliability, Semiconductor devices, Failure (quality control), Transistors, Metal oxide semiconductors, Electronic equipment and components, Computer applications, Modules, Systems analysis, Dimensions
ICS31.200
Title in FrenchDescription des structures d'analyse de fiabilite du mini-processeur europeen d'essai
Title in GermanBeschreibung der zuverlaessigen Teststrukturen eines Europaeischen Mini Test Chip
CommitteeEPL/501
ISBN0 580 26037 2
PublisherBSI
FormatA4
DeliveryNo
Pages38
File Size859.1 KB
NotesThis standard has been withdrawn as it is identical to ENV 50219:1996, which has been withdrawn by CLC/SR 93
Price£214.00


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