PD 6598:1996, CENELEC Report R117-005:1995 - Measurement techniques for the characterization of the European mini test chip

PD 6598:1996, CENELEC Report R117-005:1995

Measurement techniques for the characterization of the European mini test chip

Status : Withdrawn   Published : July 1996

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Standard NumberPD 6598:1996, CENELEC Report R117-005:1995
TitleMeasurement techniques for the characterization of the European mini test chip
StatusWithdrawn
Publication Date15 July 1996
Withdrawn Date01 May 2004
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsCENELEC Report R117-005:1995
DescriptorsMicroprocessor chips, Digital integrated circuits, Metal oxide semiconductors, Transistors, Capacitors, Thickness measurement, Electrical measurement, Capacitance measurement, Dimensional measurement, Current measurement, Frequency measurement
ICS31.200
Title in FrenchTechniques de mesurement de la characterisation du mini-processeur europeen d'essai
Title in GermanMesstechniken fuer die Bestimmung des Europaeischen Mini Test Chip
CommitteeEPL/501
ISBN0 580 25804 1
PublisherBSI
FormatA4
DeliveryNo
Pages28
File Size1.77 MB
NotesThis standard has been withdrawn as it is outdated and no longer in general use.
Price£182.00


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