PD 6595:1996, CENELEC Report R117-006:1995 - Parameter extraction techniques for the European mini test chip

PD 6595:1996, CENELEC Report R117-006:1995

Parameter extraction techniques for the European mini test chip

Status : Withdrawn   Published : May 1996

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Standard NumberPD 6595:1996, CENELEC Report R117-006:1995
TitleParameter extraction techniques for the European mini test chip
StatusWithdrawn
Publication Date15 May 1996
Withdrawn Date01 May 2004
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsCENELEC Report R117-006:1995
DescriptorsIntegrated circuits, Digital integrated circuits, Metal oxide semiconductors, Microprocessor chips, Test equipment, Electronic equipment and components, Transistors
ICS31.200
Title in FrenchTechniques d'extraction de parametres du mini-processeur europeen d'essai
Title in GermanMerkmal Extraktion Techniken fuer den Europaeischen Mini Test Chip
CommitteeEPL/501
ISBN0 580 25604 9
PublisherBSI
FormatA4
DeliveryNo
Pages38
File Size2.129 MB
NotesThis standard has been withdrawn as it is outdated and no longer in general use.
Price£182.00


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*To ask about withdrawn titles contact the
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