BS CECC 50000:Supplement No. 1:1983 - Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average

BS CECC 50000:Supplement No. 1:1983

Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average

Status : Current   Published : May 1983

Format
PDF

Format
HARDCOPY



Specifies procedures to be used for a trial of the CECC assessed process average production of non-operative semiconductor devices.




Standard NumberBS CECC 50000:Supplement No. 1:1983
TitleHarmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
StatusCurrent
Publication Date31 May 1983
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsCECC 50000:Supplement 1
Draft Superseded By81/30525 DC
DescriptorsSemiconductor devices, Semiconductor diodes, Semiconductor rectifiers, Transistors, Thyristors, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Statistical quality control, Quality control, Semiconductor technology, Average, Process specification
ICS31.080.99
Title in FrenchSystème harmonisé d'assurance de la qualité des composants électroniques. Spécification générique: dispositifs discrets à semiconducteurs. Estimation CECC de la qualité moyenne
Title in GermanHarmonisiertes Guetebestaetigungssystem fuer Bauelemente der Elektronik. Fachgrundspezifikation: Einzel Halbleiterbauelemente. CECC-bestaetigte mittlere Fertigungsqualitaet
CommitteeEPL/47
ISBN0 580 11979 3
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size335.5 KB
Price£110.00


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