BS 9400:1970 - Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test

BS 9400:1970

Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test

Status : Superseded, Withdrawn   Published : October 1970 Replaced By : BS CECC 90000:1985

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Forms part of the system of standards for electronic parts of assessed quality. Terms, definitions, test methods and other material necessary to implement fully the detail specifications for integrated electronic circuits. Included in section 2 are the general rules for preparation of detail specifications.




Standard NumberBS 9400:1970
TitleSpecification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test
StatusSuperseded, Withdrawn
Publication Date30 October 1970
Confirm Date15 April 1991
Withdrawn Date20 January 2009
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS CECC 90000:1985
Amended ByAMD 5546
AMD 7224
AMD 3466
AMD 4637
AMD 839
AMD 1435
AMD 2282
AMD 2683
Draft Superseded By68/24470 DC86/23035 DC90/30954 DC
DescriptorsIntegrated circuits, Electronic equipment and components, Circuits, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Definitions, Graphic symbols, Symbols, Marking, Statistical quality control, Quality control, Ratings, Testing conditions, Sampling methods, Safety measures, Temperature measurement, Electrical testing, Electrical measurement, Test equipment, Voltage measurement, Current measurement, Time measurement, Performance testing, Short-circuit current tests, Capacitance measurement, Impedance measurement, Environmental testing, Leak tests, Solderability testing, Solvent-resistance tests, Radiographic testing, Defects, Thermal testing, Endurance testing, Detail specification
ICS31.200
Title in FrenchCircuits electroniques integres et micro-ensembles de qualite evaluee (procedures d'homologation de qualification): caracteristiques generiques et methodes d'essai
Title in GermanIntegrierte Schaltungen und Mikrobaugruppen (guetebestaetigt). Spezifikation. Qualitaetsbestaetigungsprozeduren. Generische Daten und Pruefverfahren
CommitteeEPL/47
ISBN0 580 06284 8
PublisherBSI
FormatA4
DeliveryNo
Pages280
File Size0 KB
Price£342.00


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