Descriptors | Digital integrated circuits, Integrated circuits, Monolithic integrated circuits, Metal oxide semiconductors, Alternating current, Quality assurance systems, Assessed quality, Approval testing, Inspection, Specification (approval), Specifications, Electronic equipment and components, Electrical components, Voltage, Electric current, Temperature, Testing conditions, Leakage currents, Capacitance, Waveforms, Noise (spurious signals), Test equipment, Circuits, Electrical testing, Electric terminals, Numerical designations, Packages, Dimensions, Quality control, Statistical quality control |