BS EN ISO 9220:1995 - Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

BS EN ISO 9220:1995

Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Status : Current   Published : September 1989

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Standard NumberBS EN ISO 9220:1995
TitleMetallic coatings. Measurement of coating thickness. Scanning electron microscope method
StatusCurrent
Publication Date29 September 1989
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsEN ISO 9220:1994,ISO 9220:1988
Amended ByAMD 8499
Draft Superseded By87/53727 DC
DescriptorsMetal coatings, Thickness measurement, Microscopic analysis, Electron microscopes, Testing conditions, Errors, Calibration, Specimen preparation, Metallography
ICS17.040.20
25.220.40
Title in FrenchRevêtements métalliques. Mesurage de l'épaisseur de revêtement. Méthode au microscope électronique à balayage
Title in GermanMetallische Ueberzuege. Messung der Schichtdicke. Verfahren mit Rasterelektronenmikroskop
CommitteeSTI/33
ISBN0 580 17640 1
PublisherBSI
FormatA4
DeliveryYes
Pages18
File Size382 KB
Price£130.00


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