BS CECC 90112:1987 - Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

BS CECC 90112:1987

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

Status : Current   Published : August 1987

Format
PDF

Format
HARDCOPY






Standard NumberBS CECC 90112:1987
TitleSpecification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
StatusCurrent
Publication Date15 August 1987
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsCECC 90112:1986
Amended ByAMD 8165
DescriptorsMonolithic integrated circuits, Testing conditions, Direct-access storage, Metal oxide semiconductors, Detail specification, Silicon, Quality control, Qualification approval, Semiconductor devices, Specification (approval), Integrated memory circuits, Semiconductor storage, Digital integrated circuits, Electronic storage, Assessed quality, Approval testing, Statistical quality control, Inspection, Computer storage devices, Electronic equipment and components, Quality assurance systems, Digital circuits, Integrated circuits, Circuits
ICS31.200
Title in FrenchSystème harmonisé d'assurance de la qualité des composants électroniques. Spécification particulière cadre. Mémoires RAM dynamiques lecture/écriture à circuits intègres
Title in GermanHarmonisiertes Guetebestaetigungssystem fuer Bauelemente der Elektronik. Vordruck fuer Bauartspezifikation. Integrierte dynamische MOS Schreib-/Lese- speicherschaltungen
CommitteeEPL/47
ISBN0 580 35840 2
PublisherBSI
FormatA4
DeliveryYes
Pages20
File Size537 KB
Price£130.00


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