BS 6493-3:1985, IEC 60749:1984 - Semiconductor devices. Mechanical and climatic test methods

BS 6493-3:1985, IEC 60749:1984

Semiconductor devices. Mechanical and climatic test methods

Status : Superseded, Withdrawn   Published : January 1986 Replaced By : BS EN 60749:1999, IEC 60749:1996

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Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.




Standard NumberBS 6493-3:1985, IEC 60749:1984
TitleSemiconductor devices. Mechanical and climatic test methods
StatusSuperseded, Withdrawn
Publication Date31 January 1986
Withdrawn Date15 April 2000
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60749:1984
Amended ByAMD 7121
AMD 8089
Draft Superseded By88/22778 DC
DescriptorsSemiconductor devices, Integrated circuits, Electronic equipment and components, Environmental testing, Mechanical testing, Testing conditions, Torsion testing, Electric terminals, Electric wires, Visual inspection (testing), Solderability testing, Joints, Pull-out tests, Shear testing, Damp-heat tests, Leak tests, Radioactive tracer methods, Thermal testing, Test equipment, Circuits, Fire tests, Flammability, Marking, Endurance testing, Defects
ICS31.080.01
31.200
Title in FrenchDispositifs à semiconducteurs. Essais mécaniques et climatiques
Title in GermanHalbleiter Bauelemente. Verfahren fuer die mechanische Pruefung und die Klimapruefung
CommitteeEPL/47
ISBN0 580 14842 4
PublisherBSI
FormatA4
DeliveryNo
Pages42
File Size811.6 KB
Price£214.00


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