BS CECC 20000:1983 - Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

BS CECC 20000:1983

Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

Status : Current, Obsolescent, Superseded   Published : June 1983 Replaced By : BS EN 120000:1996

Format
PDF

Format
HARDCOPY



Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.




Standard NumberBS CECC 20000:1983
TitleHarmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
StatusCurrent, Obsolescent, Superseded
Publication Date30 June 1983
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 120000:1996
International RelationshipsCECC 20000,CECC 20000:Supplement 1
Amended ByAMD 4606
AMD 5800
Draft Superseded By77/26391 DC
DescriptorsOptoelectronic devices, Semiconductor devices, Liquid crystal devices, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Marking, Designations, Sampling methods, Testing conditions, Environmental testing, Solderability testing, Mechanical testing, Orientation, Leak tests, Endurance testing, Optical measurement, Luminous intensity, Luminance, Radiant flux density, Test equipment, Circuits, Wavelengths, Radiometry, Bandwidths, Performance testing, Light distribution, Electrical testing, Electrical measurement, Voltage measurement, Current measurement, Resistance measurement, Capacitance measurement, Thermal-cycling tests, Time measurement, Flashover, Surges (electrical), Overvoltage tests, Short-circuit current tests, Light-emitting devices, Light-emitting diodes, Photodiodes, Infrared radiation, Phototransistors, Couplers
ICS31.120
31.260
Title in FrenchSystème harmonisé d'assurance de la qualité des composants électroniques: spécification générique: dispositifs à semiconducteurs optoélectroniques et à cristaux liquides
Title in GermanHarmonisiertes Guetebestaetigungssystem fuer Bauelemente der Elektronik: Fachgrundspezifikation: optoelektronische Halbleiter und Fluessigkristallbauelemente
CommitteeEPL/47
ISBN0 580 11941 6
PublisherBSI
FormatA4
DeliveryYes
Pages100
File Size5.942 MB
NotesThis standard has been declared obsolescent
Price£274.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Develop a PAS

Develop a fast-track standardization document in 9-12 months


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


BSOL

The faster, easier way to work with standards