BS 9300:1969 - Specification for semiconductor devices of assessed quality: generic data and methods of test

BS 9300:1969

Specification for semiconductor devices of assessed quality: generic data and methods of test

Status : Superseded, Withdrawn   Published : July 1969 Replaced By : BS CECC 50000:1987

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Forms part of the system of standards for electronic components of assessed quality. Terms, definitions, test methods and other material necessary to implement fully the detail specifications for semiconductor devices. Included in section 2 are the general rules for preparation of detail specifications. Appendix C gives the agreed procedure for the adoption of specifications in the CV7000 series into the BS 9000 system. See also PD 6460.




Standard NumberBS 9300:1969
TitleSpecification for semiconductor devices of assessed quality: generic data and methods of test
StatusSuperseded, Withdrawn
Publication Date31 July 1969
Confirm Date15 November 1986
Withdrawn Date20 January 2009
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS CECC 50000:1987
Amended ByAMD 4589
AMD 3978
AMD 3091
AMD 3557
AMD 670
AMD 682
AMD 855
AMD 2132
AMD 2589
AMD 7517
Draft Superseded By89/32477 DC
DescriptorsSemiconductor devices, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Quality factor, Inspection, Specification (approval), Definitions, Marking, Colour codes, Sampling methods, Ratings, Rated voltage, Visual inspection (testing), Testing conditions, Defects, Environmental testing, Fire tests, Flammability, Mechanical testing, Solvent-resistance tests, Adhesion tests, Leak tests, Electrical testing, Electrical measurement, Test equipment, Circuits, Performance testing, Thermal testing, Accelerated testing, Detail specification, Quality control, Statistical quality control, Temperature measurement, Voltage measurement, Current measurement, Charge measurement, Capacitance measurement, Resistance measurement, Impedance measurement, Power measurement (electric), Noise (spurious signals), Sensitivity, Inductance measurement, Frequency measurement, Time measurement, Thermal-cycling tests, Endurance testing, Encapsulated, Diodes, Transistors, Oscillators, Semiconductor diodes, Suppressors, Pulse circuits, Variable capacitors, Power factor, Microwave devices, Detectors (circuits), Receivers, Attenuation, Radiofrequencies, Pulse generators, Avalanche diodes, Rectifier diodes, Thyristors, Transistors, Breakdown voltage, Microwaves, Power gain, Field-effect transistors
ICS31.080.01
Title in FrenchDispositifs semi-conducteurs de qualite evaluee: caracteristiques generiques et methodes d'essai. Specification
Title in GermanHalbleitergeraete (guetebestaetigt). Spezifikation. Generische Daten und Pruefverfahren
CommitteeEPL/47
ISBN0 580 05681 3
PublisherBSI
FormatA4
DeliveryNo
Pages428
File Size4.531 MB
Price£460.00


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