BS 6493-1.8:1985, IEC 60747-8:1984 - Semiconductor devices. Discrete devices. Recommendations for field-effect transistors

BS 6493-1.8:1985, IEC 60747-8:1984

Semiconductor devices. Discrete devices. Recommendations for field-effect transistors

Status : Superseded, Withdrawn   Published : April 1985 Replaced By : BS IEC 60747-8:2000

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Will provide general details, terminology, letter symbols, essential ratings and characteristics, and measuring methods for field effect transistors.




Standard NumberBS 6493-1.8:1985, IEC 60747-8:1984
TitleSemiconductor devices. Discrete devices. Recommendations for field-effect transistors
StatusSuperseded, Withdrawn
Publication Date30 April 1985
Withdrawn Date15 June 2001
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS IEC 60747-8:2000
International RelationshipsIEC 60747-8:1984
Amended ByAMD 8206
AMD 7212
DescriptorsRatings, Safety measures, Electronic equipment and components, Electrical testing, Semiconductor devices, Circuit properties, Definitions, Letters (symbols), Transistors, Electrical measurement, Symbols, Circuits, Noise (spurious signals), Field-effect transistors
ICS31.080.30
Title in FrenchDispositifs à semiconducteurs: dispositifs discrets et circuits intégrés. Dispositifs discrets. Recommandations pour transistors à effet de champ
Title in GermanHalbleiter-Bauelemente: Einzelhalbleiter und integrierte Schaltungen. Einzelhalbleiter. Empfehlungen fuer Feldeffekt-Transistoren
CommitteeEPL/47
ISBN0 580 14470 4
PublisherBSI
FormatA4
DeliveryNo
Pages56
File Size982.8 KB
Price£254.00


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