BS 3727-10:1964 - Methods for the analysis of nickel for use in electronic tubes and valves. Determination of silicon 0.020-0.25 per cent (photometric method)

BS 3727-10:1964

Methods for the analysis of nickel for use in electronic tubes and valves. Determination of silicon 0.020-0.25 per cent (photometric method)

Status : Withdrawn   Published : April 1964

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Standard NumberBS 3727-10:1964
TitleMethods for the analysis of nickel for use in electronic tubes and valves. Determination of silicon 0.020-0.25 per cent (photometric method)
StatusWithdrawn
Publication Date29 April 1964
Confirm Date15 December 1982
Withdrawn Date02 August 2013
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Draft Superseded ByAC(TLE)153 DC
DescriptorsNickel, Electron tubes, Chemical analysis and testing, Determination of content, Silicon, Spectrophotometry, Photometry (chemical analysis), Calibration
ICS77.120.40
Title in FrenchMethodes d'analyse du nickel utilise dans les tubes et lampes electroniques. Determination du silicium 0,020-0,25% (methode photometrique)
Title in GermanVerfahren zur Analyse von Nickel in elektronischen Roehren und Ventilen. Bestimmung von Silizium 0,020-0,25% (photometrisches Verfahren)
CommitteeL/-/99
ISBN0 580 03627 8
PublisherBSI
FormatA4
DeliveryNo
Pages8
File Size240.2 KB
NotesThis standard has been withdrawn as the standard is no longer relevant
Price£110.00


WITHDRAWN TITLE
*To ask about withdrawn titles contact the
BSI Customer Services
cservices@bsigroup.com, +44 345 086 9001
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