BS ISO 22415:2019 - Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials

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BS ISO 22415:2019

Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials

Status : Current   Published : May 2019

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 22415:2019
TitleSurface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
StatusCurrent
Publication Date14 May 2019
Cross ReferencesISO 18115-1:2013, ISO/TR 15969, ASTM E 1438
International RelationshipsISO 22415:2019
Draft Superseded By18/30362138 DC
DescriptorsSurface properties, Surfaces, Chemical analysis and testing, Vocabulary, Definitions, Spectroscopy
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Spectrométrie de masse des ions secondaires. Méthode de détermination du rendement volumique dans le cadre du profilage en profondeur de matériaux organiques par pulvérisation d'argon en grappe
CommitteeCII/60
ISBN978 0 580 98908 7
PublisherBSI
FormatA4
DeliveryYes
Pages38
File Size2.162 MB
Price£206.00


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