BS IEC 60747-18-1:2019 - Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

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BS IEC 60747-18-1:2019

Semiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Status : Current   Published : June 2019

Format
PDF

Format
HARDCOPY






Standard NumberBS IEC 60747-18-1:2019
TitleSemiconductor devices. Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
StatusCurrent
Publication Date07 June 2019
International RelationshipsIEC 60747-18-1:2019
DescriptorsCalibration, Data analysis, Test methods, Sensors, Semiconductor devices
ICS31.080.99
CommitteeEPL/47
ISBN978 0 580 95779 6
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size1.735 MB
Price£176.00


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