BS EN 60749-17:2003 - Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

BS EN 60749-17:2003

Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

Status : Superseded, Withdrawn   Published : June 2003 Replaced By : BS EN IEC 60749-17:2019

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Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.




Standard NumberBS EN 60749-17:2003
TitleSemiconductor devices. Mechanical and climatic test methods. Neutron irradiation
StatusSuperseded, Withdrawn
Publication Date19 June 2003
Withdrawn Date15 May 2019
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN IEC 60749-17:2019
International RelationshipsIEC 60749-17:2003,EN 60749-17:2003
Amended ByAMD 15223
Corrigendum, June 2004
DescriptorsSemiconductor devices, Degradation, Space technology components, Nuclear particles, Mechanical testing, Environmental testing, Radiation measurement, Dosimeters, Military engineering, Integrated circuits, Military equipment, Neutrons, Climate, Destructive testing, Electronic equipment and components, Irradiation
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Irradiation aux neutrons
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Neutronenbestrahlung
CommitteeEPL/47
ISBN0 580 42063 9
PublisherBSI
FormatA4
DeliveryYes
Pages10
File Size349 KB
Price£110.00


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