BS EN 60444-8:2003 - Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units

BS EN 60444-8:2003

Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units

Status : Revised, Superseded, Withdrawn   Published : November 2003 Replaced By : BS EN 60444-8:2017

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Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.




Standard NumberBS EN 60444-8:2003
TitleMeasurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
StatusRevised, Superseded, Withdrawn
Publication Date19 November 2003
Withdrawn Date26 May 2017
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60444-8:2017
ReplacesPD IEC/PAS 62277:2002, IEC/PAS 62277:2001
International RelationshipsEN 60444-8 (IEC 60444-8:2003),IEC 60444-8:2003
Draft Superseded By01/208154 DC
DescriptorsElectrical properties and phenomena, Phase measurement (electric), Quartz, Electrical equipment, Crystals (electronic), Crystal resonators, Electrical wave measurement, Dielectric devices, Resonators, Piezoelectric devices, Frequencies, Circuits, Electronic equipment and components, Electrical measurement, Calibration
ICS31.140
Title in FrenchMesure des parametres des resonateurs a quartz. Dispositif d'essai pour les resonateurs a quartz montes en surface
Title in GermanMessung von Schwingquarz-Parametern. Pruefaufbau fuer oberflaechenmontierbare Schwingquarze
CommitteeEPL/49
ISBN0 580 42953 9
PublisherBSI
FormatA4
DeliveryYes
Pages14
File Size375 KB
Price£110.00


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